Publication date: 14th September 2021
High-resolution imaging techniques based on thermography, luminescence imaging, and laser beam induced current (LBIC) probe and inspect solar cells and correlate the
observed inhomogeneities to the cell performance. The imaging
methods get increasingly qualitative as the size scales from
cell level to module dimensions where several solar cells are
connected in series, as in silicon panels. Electroluminescence
(EL) imaging is a standard measure of inspecting solar panels
and extensively utilized in the manufacturing assembly line.
The complementary method of obtaining images from the LBIC
scanning technique however is rarely utilized at large panel
dimensions. We report strategies to implement LBIC imaging at
module levels and procedures to analyze in terms of microscopic
and circuit parameters. LBIC is inherently quantitative and well
suited to identify microscopic defects since it involves measuring
local photo-current. We demonstrate that the contrast features
from LBIC in a specific cell region are directly associated with
the shunt resistance (Rsh) variation of that specific cell. Using a
single diode equivalent circuit model, we show that the current
contrast of the cell under study is purely a function of its Rsh, and
an effective load resistance that includes shunt-resistance of the
other series-connected cells. The resulting LBIC-map along with
EL then becomes a complete diagnostic tool to quantitatively map
and identify the defects prevailing in a solar panel. We overcome
the key issue of the slow speed of LBIC based imaging by a
modified scan routine for rapid screening of large areas (2 m by
1 m) panels under 5 min, at high resolution.
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