Publication date: 1st July 2014
Converting solar energy into electricity provides a much-needed solution to the energy crisis the world is facing today. Over the last 12 months perovskite solar cells, emerging from the field of DSSC, have exhibited a rapidly rising evolution, with efficiency surpassing 15%. Moreover, in order to enhance light harvesting, the addition of core-shell nanoparticles has been investigated in several thin film devices.
The morphology of the active layer plays a key role in the understanding the working principles, and optimising the operation of thin films devices. Analytical transmission electron microscopy (TEM) represents a powerful tool that allows probing nanoscale morphology and crystal structure, as well as local elemental composition and spatially-resolved information on the electronic energy levels.
In this work cross sectional lamellar specimens of perovskite - based solar cells were prepared from full photovoltaic devices using a focused ion beam milling approach. The sections were analysed by high annular dark field imaging in scanning TEM mode to determine the morphology of the device and by energy dispersive X-ray spectroscopy (EDX) to obtain compositional maps at high spatial resolution.
Spectrum images were analysed using principal component analysis and blind source separation to optimise signal-to-noise ratio, thus obtaining high quality maps while limiting the electron dose on the specimen. This novel quantification procedure also naturally separates different compounds without introducing operator bias, and is particularly effective in the presence of complex compounds, such as those developed during solution-based perovskite synthesis .