Coupled Electrochemical and Structural Analysis of Interfaces Using Multislice Electron Ptychography
Colin Gilgenbach a, Thomas Defferriere a, Harry Tuller a, James LeBeau a
a Department of Materials Science and Engineering, Massachusetts Institute of Technology
Proceedings of 24th International Conference on Solid State Ionics (SSI24)
Advanced characterisation techniques: fundamental and devices
London, United Kingdom, 2024 July 14th - 19th
Organizers: John Kilner and Stephen Skinner
Oral, Colin Gilgenbach, presentation 327
Publication date: 10th April 2024

Interfaces are key to the properties of ionic materials. In particular, space charges at grain boundaries dictate grain boundary ionic resistance. In this talk, we use multislice electron ptychography to characterize atomic structure and space charge potential at grain boundaries in ionic conductors simultaneously. Existing methods for measuring space charge potentials at grain boundaries have significant limitations. For example, quantifying the potential present in space charge regions is challenging because these features are small—on the order of nanometers. Bulk measurement techniques like electrochemical impedance spectroscopy (EIS) fail to account for the diversity of grain boundaries and grain boundary properties present in bulk specimens. Existing transmission electron microscopy (TEM) and atom-probe tomography (APT) techniques are well-suited to chemical analysis of grain boundaries but provide only an indirect or semi-quantitative estimation of space charge potential. In this talk, we use multislice electron ptychography to characterize space charges at grain boundaries in Gd-doped CeO2. Multislice ptychography provides a 3D, quantitative measurement of potential, and is sensitive both to the high spatial frequency, strongly scattering atomic cores as well as the diffuse, weaker space charge potential—unlike other electron microscopy techniques. This allows the simultaneous reconstruction of atomic-resolution structural features and local space charge potential. Applied to ionic conductors, this allows observation of the coupling between grain boundary structure and electrochemical properties and, in turn, provides a path towards the design of materials with targeted interfacial properties.

The authors acknowledge support from the Department of Homeland Security Advanced Research Initiative (22CWDARI00046-01-00). This work was carried out in part using the facilities at MIT.nano.

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