Phase-separated nanostructures of Ni:STO studied using low temperature Scanning Tunneling Microscopy and Spectroscopy
Yen-Po Liu a, Moritz L. Weber a, Dylan Jennings b c, Felix Gunkel a, Regina Dittman a
a Peter Grünberg Institute, Electronic Materials (PGI-7), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
b Institute of Energy and Climate Research, Materials Synthesis and Processing (IEK-1), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
c Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Materials Science and Technology (ER-C 2), Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Proceedings of 24th International Conference on Solid State Ionics (SSI24)
Advanced characterisation techniques: fundamental and devices
London, United Kingdom, 2024 July 14th - 19th
Organizers: John Kilner and Stephen Skinner
Oral, Yen-Po Liu, presentation 142
Publication date: 10th April 2024

Transition metal doped SrTiO3 is of significance for devices in energy1,2, information3,4, and catalysis5. With the growth characterization of Ni-doped SrTiO3 (Ni:STO), spontaneous formation of separated nano-phases is observed. In view of controlling the formation of such nano-phases and in a wider context for vertically aligned nanocolumn engineering6, our focus is on the growth mechanism of Ni:STO with Ni dopant enrichment in designated areas of the perovskite lattice, associated to the occasional formation of nano-phases embedded in a Ni-doped STO matrix.

Scanning Tunneling Microscopy and Spectroscopy (STM/S) are unique surface techniques for mapping both precise topography and electronic properties down to the atom scale, making them a promising instrument for studying nanostructures, even within device structures7.

In this study, we investigate the reflection high-energy electron diffraction-controlled pulsed laser deposition (PLD) grown 0.25 unit cell (u.c.), 0.5 u.c., and 10 u.c. Ni:STO on Nb-doped SrTiO3 (Nb:STO) using low-temperature (LT) STM/S at 4.6 K in ultra-high vacuum (UHV). Upon in situ transfer to the LT-STM, the as-deposited samples with less than 1 u.c. show surface morphology with Ni:STO islands and bare Nb:STO spaces in between the islands, called trenches. Surprisingly, the trenches of the 0.5 u.c. sample already show specific patterns that can be corresponding to the nanocolumn patterns on a thick film, similar to vertically aligned nanostructures (VAN) morphologies observed in the literature.8 Film thickness of about 4.1 Å (lattice constant of STO~3.9 Å) is observed on both the 0.25 and 0.5 u.c. samples. Above the monolayer Ni:STO, homogeneously dispersed nanoparticles with diameters ranging between 2 and 3 nm exhibit low-density distribution. Local electronic properties of the nanostructures are investigated by performing STS and dI/dV, which yield spectra proportional to the local density of states. A bandgap of about 3.4 eV is seen on the Ni:STO film (tip-induced band bending takes part in the STS measurement), while the nanoparticles show a similar bandgap with extra sharp states 1.1 eV above the Fermi level, indicating increased p-doping concentration in the oxide nanoparticle. The STS on the Nb:STO substrate reveals a broader bandgap, exceeding 4 eV, attributed to the formation of Sr vacancies creating a space charge at the surface region9.

The study presents the very early stage formation process and the dopant distribution of the embedded nano-phase Ni:STO, allowing for improved control of such nanostructures, likely also relevant to understand the nucleation of VANs.

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