Proceedings of Online International Conference on Hybrid and Organic Photovoltaics (OnlineHOPV20)
Publication date: 22nd May 2020
Optoelectronic techniques such as the combination of transient photovoltage/photocurrent (TPV/TPC) and differential capacitance measurements have been instrumental in furthering our understanding of how the charge carrier kinetics in the device under operating conditions by directly relating the charge in the device to the charge carrier lifetime. Thereby, the recombination order (δ) can be calculated.
Examples are the investigations on the effect of partial halide substitution [1], perovskite crystallinity [2], and different hole transport layers [3]. Recently, there has been some debate about the influence of the device capacity on the correct interpretation of measured lifetimes and charge carrier densities [4], [5]. Here we demonstrate the validity of our charge carrier lifetime and device capacitance values for two typical solution processed p-i-n devices with differing perovskite quality. Adequately analysed, Transient Photovoltage and Differential Capacitance offer a facile route to qualitatively compare charge carrier kinetics across devices as well as determening accurate values for the combined recombination order (bulk first order and second order processes, surface recombination etc.) of the device.