Proceedings of Online International Conference on Hybrid and Organic Photovoltaics (OnlineHOPV20)
Publication date: 22nd May 2020
XPS samples less than 10 nm into a film surface. As such it is a routine quantification method for thin films. However, use in the perovskite literature shows sometimes variable data - with some species such as Pb(0) being erratic in appearance.
The surface of a film under examination in ultrahigh vacuum, with prolonged X-ray exposure, & potential sample charging, may induce chemistry formation that may not occur during real world applications.
Given that the same MAPI film can generate a wide range of stoichiometry if analysis conditions – including experiment time - are not carefully controlled, there is a clear source of variability.
Given also that PbX2 materials are prone to photo-reduction by X-rays in their own right, it must be asked if the presence of Pb(0) is often just an indicator of PbI2 enrichment due to manufacturing conditions, time in the instrument, or simply aging of the perovskite film between manufacture and analysis.
In this work we examine the factors causing variability of analyses by XPS and suggest that (X-ray) photolysis of PbI2 is a ready source of Pb(0). As such we advise a sceptical caution during the analysis of Pb(0) in perovskite systems.