Proceedings of nanoGe Spring Meeting 2022 (NSM22)
DOI: https://doi.org/10.29363/nanoge.nsm.2022.017
Publication date: 7th February 2022
The properties of emerging non-precious metal (oxy)hydroxide electrocatalysts for the oxygen evolution reaction (OER) evolve dynamically with voltage during operation. Understanding how material properties govern the kinetics of electron and ion transfer during the OER requires integrating electrochemical cells into advanced characterization methods to study reactivity during operation. Further, the sub-particle spatial heterogeneity of electrocatalysts during operation requires that these operando methods must be able to image the local chemical, physical, and electronic structure at the nanoscale and link these properties to the local electrochemical activity.
In this talk, I will describe a suite of correlative operando microscopy techniques we have developed to study the OER on faceted Co (oxy)hydroxide nanoplatelets.[1] Operando Scanning X-Ray Transmission Microscopy (STXM) and Electrochemical Atomic Force Microscopy (EC-AFM) are used to map the local Co oxidation state and particle morphology across voltages spanning the bulk ion insertion reactions and OER regimes. These results are correlated to local electrochemical activity maps obtained through Scanning Electrochemical Cell Microscopy (SECCM) providing insight into where and why oxygen is evolved on the Co (oxy)hydroxide platelets. These experimental material properties and local reactivity measurements are integrated into a computational model that combines thermodynamic adsorption energetics of OER surface intermediates and microkinetic modeling to derive the experimental electrochemical Tafel behavior through first principles.[2] The results from our multi-modal correlative approach alter long standing assumptions about the OER-active properties of the Co (oxy)hydroxide system and provide an improved methodology towards developing predictive electrocatalytic theories based on material properties that govern reactivity away from open circuit conditions.