Proceedings of International Conference on Perovskite Thin Film Photovoltaics and Perovskite Photonics and Optoelectronics (NIPHO20)
DOI: https://doi.org/10.29363/nanoge.nipho.2020.038
Publication date: 25th November 2019
The precise determination of the wavelength dependent complex refractive index of metal-halide perovskite nanocrystals is key for the design a new generation of optoelectronic devices. Herein, we perform an in-depth optical and structural characterization of methyammonium lead iodide and methyammonium lead bromide nanocrystals embedded into silicon dioxide nanoparticle thin films in order to extract, for the first time, the optical constants of metal-halide perovskite nanocrystals. Using a Kramers-Kronig consistent dispersion model along with an effective medium approximation it is possible to derive the real and imaginary parts of the complex refractive index of neat nanocrystals by fitting the spectral dependence of light transmitted and reflected on nanocrystal-based films at different angles and polarizations of the incident beam. Our results yield a strong dependence of the optical constants with the nanocrystal size, featuring small nanocrystals remarkably large values of the extinction coefficient. Based on actual optical characterization data, our analysis opens the door to the rigorous modelling of solar cells and light-emitting diodes with active layers based on perovskite nanocrystals.