Proceedings of International Conference on Perovskite Thin Film Photovoltaics and Perovskite Photonics and Optoelectronics (NIPHO20)
DOI: https://doi.org/10.29363/nanoge.nipho.2020.011
Publication date: 25th November 2019
Metal halide perovskite materials exhibit exceptional performance characteristics for low-cost optoelectronic applications. Though widely considered defect tolerant materials, perovskites still exhibit a sizeable density of deep sub-gap non-radiative trap states, which create local variations in photoluminescence [1] that fundamentally limit device performance. These trap states have also been associated with light-induced halide segregation in mixed halide perovskite compositions [2] and local strain [3], both of which can detrimentally impact device stability [4]. The origin and distribution of these trap states remains unknown as the optical diffraction-limit does not allow the nature of the traps to be probed on the length scales required. Understanding the nature of these traps will be critical to ultimately eliminate losses and yield devices operating at their theoretical performance limits with optimal stability.
In this talk we outline the distribution and compositional and structural origins of non-radiative recombination sites in (Cs0.05FA0.78MA0.17)Pb(I0.83Br0.17)3 thin films. By combining scanning electron and synchrotron X-Ray microscopy techniques with photoemission electron microscopy (PEEM) measurements we reveal that nanoscale trap clusters are distributed non-homogenously across the surface of high performing perovskite films and that there are distinct structural and compositional fingerprints associated with the generation of these detrimental sites. In addition, our scanning electron diffraction measurements achieve a spatial resolution of 4nm with an accumulated electron dose of only ~6 e/Å2 (over an order of magnitude lower than established tolerable dose limits for metal halide perovskites). We will also explore how this combination of high-resolution and low accumulated dose provides new insights into the pristine crystallography of these materials on the nanoscale; thus helping to answer ongoing open questions such as ‘what truly defines a grain?’ and ‘are grain boundaries beneficial or detrimental to performance’?
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