Proceedings of nanoGe International Conference on Perovskite Solar Cells, Photonics and Optoelectronics (NIPHO19)
DOI: https://doi.org/10.29363/nanoge.nipho.2019.014
Publication date: 21st November 2018
Metal halide perovskites are generating enormous interest for their use in optoelectronic devices including photovoltaics and light-emitting diodes. One of their most remarkable properties is their apparent defect tolerance – films can be produced using relatively crude processing methods yet they still exhibit very good device performance. Calculations have suggested that this is at least partly because many defects cause only shallow trap states which may not be catastrophic for device performance (unlike deeper trap states). Nevertheless, there is still substantial non-radiative losses suggesting defects are not entirely benign and they still must be understood and addressed before devices can approaches their performance limits.
Here, I will cover our ongoing work focusing on defects and their impact on non-radiative losses, as well as their mitigation through passivation treatments. I will present recent results in which we use multimodal approaches to determine relationships between local chemistry, structural and luminescence properties in perovskite thin films using synchrotron nano X-Ray Diffraction (n-XRD) and nano X-Ray fluorescence (n-XRF) measurements, as well as confocal and wide-field luminescence imaging. We reveal an intimate connection between strain and non-radiative decay, revealing these strain related defects as a primary origin of non-radiative losses. I will also outline the action of passivation treatments, such as chemical and light-induced treatments, on relieving these strain patterns.
The work provides a platform for designing new and more effective passivation post-treatments or film fabrication methods, which will push devices ever closer to their efficiency limits.