Proceedings of nanoGe Fall Meeting 2021 (NFM21)
DOI: https://doi.org/10.29363/nanoge.nfm.2021.179
Publication date: 23rd September 2021
Photoluminescence originating from the recombination of electrons and holes within the absorber layers in solar cells is an important characterization technique for many photovoltaic technologies as it provides direct information about the separation of the quasi Fermi levels (QFL) inside the device. The photoluminescence (PL) in organic donor/acceptor (D/A) systems is typically dominated by local excitons which decay radiatively before dissociation into free charge carriers at the D/A interface. Thus, this (major) part of the PL signal neither correlates with the separation of the QFL nor with the operational state of the device. In contrast, during electroluminescence (EL) experiments electrons and holes are injected in their respective material phases directly and recombine pairwise at the D/A interface (partially radiatively). Therefore, the EL radiation is proportional to the product of electron and hole concentrations and thus directly to the QFL separation. In this work, we determine the time resolved QFL separation during charge carrier decay from transient EL within the absorber of high-efficiency organic solar cells, compare it to the externally measured voltage at the contacts and demonstrate the applicability of this method for a wide range of injection currents. We further show the potential of this measurement technique to get direct insights in the recombination dynamics of electrons and holes within organic D/A materials.
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