Proceedings of nanoGe Fall Meeting 2021 (NFM21)
DOI: https://doi.org/10.29363/nanoge.nfm.2021.008
Publication date: 23rd September 2021
Nano- and meso- scale materials properties are crucial to the macroscopic performance of a wide range of functional and photovoltaic devices. Photoconductivity, ferroelectricity, and coupled effects have been microscopically investigated for decades, especially in 2-dimensions using continuously evolving variations of Atomic Force Microscopy. Our work, along with many others, reveals how these properties are frequently mediated by strain, orientation, grain boundaries, and other microstructural defects or heterogeneities. However, practical devices are often sensitive to, or even controlled by, otherwise inaccessible sub-surface effects or thickness dependencies related to microstructure and concentration, polarization, and/or field gradients. Therefore, we are advancing Tomographic AFM for volumetric materials property mapping, with voxels of properties on the order of ~10 nm3. With polycrystalline photovoltaics such as MAPbI3 and CdTe, tomographic photoconductive AFM literally uncovers new pathways to improve carrier separation via inter- and intra- granular defects. For BiFeO3, Tomographic piezo-force microscopy confirms Kay-Dunn thickness scaling, LGD behavior with a minimum switchable thickness of <5 nm, and even co-located domain and current maps which together directly reveal sub-surface topological defects. In multiferroic CoFe2O4-BiFeO3 vertically aligned nanocomposites, TAFM directly visualizes lateral strain coupling, while superlattices demonstrate depth resolution on the few nanometer scale. Such volumetric insight is increasingly important for engineering optimal performance and reliability of real-world, 3-Dimensional materials devices for energy production and/or efficiency.
This work is funded by NSF-DMR-1726862, the UConn Institute of Materials Science, and Murata Manufacturing.