Proceedings of nanoGe Fall Meeting19 (NFM19)
Publication date: 18th July 2019
Understanding the origin of major carrier losses in perovskite solar cells is key to increase the final device photovoltaic efficiency. In this regard, the reduction of interfacial charge carrier recombination, which supposes one of the major carrier losses, has been identified as a good strategy to get higher efficiencies. Several techniques have been used to study charge carrier recombination. Among them, transient photovoltage (TPV) has been widely used, as it allows studying charge carrier recombination under operando conditions. Interestingly, it has been described recently a novel negative transient deflection in perovskite solar cells when measuring TPV transients at the early stages of illumination. This negative deflection is correlated with the ionic accumulation at the perovskite interfaces, which is a process that requires great attention to fully understand how perovskite solar cells work. In this work, we have monitored the evolution of this negative trace with the aging of the perovskite solar cells. We correlate the disappearance of the negative signal with the enhancement of the device open-circuit voltage and fill factor, therefore, the device efficiency. We hypothesize that the increase in device efficiency is because of a better/faster ion redistribution within the perovskite material after the aging of the solar cells, which reduces charge carrier recombination at the interfaces.
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