Proceedings of nanoGe Fall Meeting19 (NFM19)
Publication date: 18th July 2019
Organic photovoltaics (OPV) have recently made great strides in terms of efficiency with reports of increased PCEs of over 15 %. Such high efficiencies in combination with other attractive properties, for example the possibility for flexible substrates, semi-transparent devices or solution processability, make OPV increasingly attractive for larger scale industrial production, especially when considering specialized applications like building-integrated photovoltaics. However, in order to efficiently produce OPV cells or modules on a larger scale, quick and reliable quality control measures are crucial. One of the most widely used means for quality control is imaging of the radiative or non-radiative recombination of solar cells, namely (lock in) thermography (LIT) and luminescence imaging. These methods are limited in some respects. For example a determination of the lateral position of a defect is easily possible, while the exact resolution of the nature of a defect, e.g. in which layer of a thin film stack a defect is located, is challenging. Our approach to overcome this difficulty is the introduction of well-defined artificial defects into certain layers of an OPV stack and subsequent imaging analysis of the defected cells. The unique response gained from cells with artificial defects can then be transferred to the imaging of cells or modules with naturally occurring manufacturing defects.
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International Conference on Hybrid and Organic Photovoltaics
International Conference on Hybrid and Organic Photovoltaics (HOPV) is celebrated yearly in May. The main topics are the development, function and modeling of materials and devices for hybrid and organic solar cells. The field is now dominated by perovskite solar cells but also other hybrid technologies, as organic solar cells, quantum dot solar cells, and dye-sensitized solar cells and their integration into devices for photoelectrochemical solar fuel production.
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