Proceedings of nanoGe Fall Meeting19 (NFM19)
DOI: https://doi.org/10.29363/nanoge.nfm.2019.186
Publication date: 18th July 2019
For the last few decades the rapid growth in the field of nanoscience and technology has led to the development of new characterization tools for nanoscale materials. Traditional IR and Raman spectroscopy and imaging offers excellent chemical insights; however, the spatial resolution is limited by the optical diffraction limit (~lambda/2). Although, recent Super-resolution microscopy techniques offer superior spatial resolution, they are primarily implemented in fluorescence imaging, hence needs external fluorophore tag for detection. Alternatively, nanoscale IR spectroscopy/imaging offers a “tag free” spectral detection with high spatial resolution beyond optical diffraction limit (2-5 mm) by exploiting an AFM probe to detect either photothermal expansion force (PTIR) or near field scattered IR light (sSNOM).
Recent developments in PTIR and sSNOM technology have significantly augmented the speed and spatial resolution for chemical analysis. One of the new developments (Tapping AFM-IR) allows acquisition of IR images at a specific absorption band simultaneously with sample topography and nano-mechanical properties, providing a complete set of topographical, chemical and mechanical insights with <10 nm spatial resolution. These high-resolution measurements are currently accompanied by high speed tunable laser enabling fast point spectral acquisition (1-2 ms/spectrum) leading to hyperspectral data cube for rigorous statistical analysis similar to Chemometrics applications.
In this presentation, we will highlight the technical background and applications of these emerging technologies in different fields, e.g., nanomaterials, life sciences, polymers, microelectronics etc.
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