Proceedings of nanoGe Fall Meeting 2018 (NFM18)
DOI: https://doi.org/10.29363/nanoge.nfm.2018.155
Publication date: 6th July 2018
Besides morphological characterization, atomic-force microscopy (AFM) based techniques can also successfully be employed to study electrical and optoelectronic properties on the nanometer scale via conductive atomic-force microscopy (C-AFM) and Kelvin Probe Force Microscopy [1]. This will be demonstrated for upright standing ZnO nanorods [2,3] radial junction Si solar cells [4]. With respect to photovoltaic applications, the operation of these techniques under simultaneous illumination with white or monochromatic light - which are called photoconductive AFM (PC-AFM) and photo-assisted KPFM (PA-KPFM) is demonstrated [3,4]. For crystalline needles composed of small organic semiconductor molecules grown on graphene, the light-induced charge spreading is measured by electrostatic force microscopy.
Work has been performed in collaboration with A. Andreev, I. Beinik, A. Nevosad, A. Matković, M. Mirkowska, M. Kratzer, K. Gradwohl, A. Matković, (Leoben), Y. Kozyrev, S. Kondratenko (Kiev), M. Müller, A. Hývl, A. Vetushka, M. Ledinský, A. Fejfar (Prague), and B. Vasić, R. Gajić (Belgrade).
[1] C. Teichert, I. Beinik, in “Scanning Probe Microscopy in Nanoscience and Nanotechnology”, Vol. 2, Edited by B. Bhushan, (ISBN 978-3-642-10496-1) (Springer-Verlag, Berlin, 2011), pp. 691-721.
[2] I. Beinik, et al., J. Appl. Phys. 110 (2011) 052005.
[3] I. Beinik, et al., Beilstein J. Nanotechnol. 4 (2013) 208.
[4] M. Müller, et al., Jap. J. Appl. Phys. 54 (2015) 08KA08.
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