Proceedings of nanoGe Fall Meeting 2018 (NFM18)
DOI: https://doi.org/10.29363/nanoge.nfm.2018.087
Publication date: 6th July 2018
We have used time-resolved transient spectroscopies to better understand both bulk carrier dynamical processes as well as surface carrier dynamics. We employed transient reflection spectroscopy to measure the surface carrier dynamics in methylammonium lead iodide perovskite single crystals and polycrystalline films. We find that the surface recombination velocity (SRV) in polycrystalline films is nearly an order of magnitude smaller than that in single crystals, likely due to unintended surface passivation of the films during synthesis. In spite of the low SRV, surface recombination limits the total carrier lifetime in polycrystalline thin films, meaning that recombination inside grains and at grain boundaries is less important than top and bottom surface recombination. The suppressed SRV in the polycrystalline films appears to be related to an excess of methylammonium compared to the single crystals surfaces, determined by X-ray photoelectron spectroscopy analysis. We studied the charge carrier dynamics in 2D Ruddlesden-Popper perovskites PEA2PbI4·(MAPbI3)n−1(PEA, phenethylammonium; MA, methylammonium; n = 1, 2, 3, 4) single crystals. We have also studied carrier dynamics in Perovskite QD samples and will discuss recent results.