Probing electronic excitations in BiFeO3 by wavelength-dependent Raman spectroscopy
Mael Guennou a
a Luxembourg Institute of Science and Technology, 41, Rue du Brill, Belvaux - Luxembourg, 4422, Luxembourg
Materials for Sustainable Development Conference (MATSUS)
Proceedings of September Meeting 2016 (NFM16)
Berlin, Germany, 2016 September 5th - 13th
Organizers: Marin Alexe, Enrique Cánovas, Celso de Mello Donega, Ivan Infante, Thomas Kirchartz, Maksym Kovalenko, Federico Rosei, Lukas Schmidt-Mende, Laurens Siebbeles, Peter Strasser, Teodor K Todorov, Roel van de Krol and Ulrike Woggon
Invited Speaker, Mael Guennou, presentation 501
Publication date: 14th June 2016

Solid knowledge of the electronic band structure of materials is a cornerstone of modern technology. In functional dielectrics and multiferroics, traditionally seen and used as insulating materials, electronic structures have been much less explored than in semiconductors. However, today, they gain in importance due to the growing interest for interactions of ferroic materials with light, namely in the context of unique photovoltaic or photoelectric properties.

In this study, we demonstrate how resonance Raman spectroscopy enables to probe electronic levels of the model multiferroic BiFeO3 (BFO). Using twelve different excitation wavelengths ranging from the blue (442 nm = 2.8 eV) to the near infrared (785 nm = 1.6 eV), we show that both the first- and second-order Raman signatures of the crystals show resonance phenomena that can be assigned to the direct and indirect band-gaps, and oxygen electronic defect levels. Temperature-dependent measurements provide the first experimental indication that the reported strong variation of the optical band-gap in BFO originates from a shrinking of the indirect electronic gap. More generally, our study suggests that Raman scattering at various wavelengths offers a powerful tool for the investigation of electronic excitations in multiferroic functional oxides (1).

(1) M. C. Weber, M. Guennou, C. Toulouse, M. Cazayous, Y. Gillet, X. Gonze and J. Kreisel, Physical Review B 93 125204 (2016).



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