Molecular Doping and Trap Passivation in Colloidal Quantum Dot Solids
Ahmad R. Kirmani a, Aram Amassain a, Marcel Said b, Seth R. Marder b, Oleksandr Voznyy c, Edward H. Sargent c
a King Abdullah University of Science and Technology (KAUST) - Saudi Arabia, 4700 King Abdullah University of Science and Technology (KAUST), Thuwal, Saudi Arabia
b Center for Organic Photonics and Electronics and School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30332-0400
c University of Toronto, King's College Road, 10, Toronto, Canada
Materials for Sustainable Development Conference (MATSUS)
Proceedings of nanoGe September Meeting 2015 (NFM15)
Santiago de Compostela, Spain, 2015 September 6th - 15th
Oral, Ahmad R. Kirmani, presentation 232
Publication date: 8th June 2015

Over the past couple of years the field of colloidal quantum dot (CQD) photovoltaics has seen significant developments with the record power conversion efficiency (PCE) reaching 9.9% largely benefitting from novel device architectures and robust surface passivation schemes. Halide-based passivation schemes have recently been shown to effectively tune the QD carrier concentrations. In general, however, the field lacks a demonstration of doping strategies for CQD solids potentially compatible with industrial scale-up.

Herein, we demonstrate a novel post-deposition molecular doping of the CQD solid leading to efficient emptying of QD valence band tails as evidenced by a work function lowering from photoemission spectroscopy (PES). We employ an organometallic molecule with a large electron affinity (EA) lying below the electronic valence band maxima (VBM) of the QDs. The trapping electrons populating the deep gap states of the QDs are expected to transfer to the lowest unoccupied molecular orbital (LUMO) of the molecule. Our density functional theory (DFT) simulations lay a firm theoretical background for the possibility of such an electron transfer. The doping procedure leads to efficient QD solar cells with ~15% enhancement in the short-circuit current density.



© FUNDACIO DE LA COMUNITAT VALENCIANA SCITO
We use our own and third party cookies for analysing and measuring usage of our website to improve our services. If you continue browsing, we consider accepting its use. You can check our Cookies Policy in which you will also find how to configure your web browser for the use of cookies. More info