Proceedings of nanoGe September Meeting 2015 (NFM15)
Publication date: 8th June 2015
Semiconductors derived from colloidally-synthesized nanocrystals (NC) are promising candidates for future-generation photovoltaics, transistors, and light-emitting devices. This is due to their low-cost fabrication as well as their tunable optical and electronic properties. Even though thin-film optoelectronic devices have been realized, the performance metrics such as power conversion efficiency (PCE) of NC-based solar cells still lag behind commercially available technologies.
Surface treatments (1, 2) have improved device performance, leading for example to air-stable operation (3) and record PCEs of 9.2% (4). In addition, Brown and co-workers have shown that the cross-linking molecules act as surface dipoles, influencing the energy levels of the composite NC-semiconductor (5). These findings open up a route for advanced band-engineering in future devices and show the need for a systematic understanding of the correlation between molecular surface chemistry and device performance.
To fill this gap, we propose a non-destructive, in-situ electrochemical measurement technique to systematically track the chemical potential of the NC film during its solution-based fabrication. In contrast to existing methods, such as ultraviolet photoelectron spectroscopy, our technique not only reduces the feedback-time for understanding NC-film characteristics but also allows monitoring during the step-by-step dip-coating process for film thickness-dependent insight into the Fermi level. To demonstrate this technique, we compare the energy levels of PbS NC-solids cross-linked with different ligands and explore how ligand mixtures can be used as a tool to modify the NC-thin film energy levels in a controlled fashion.
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