Publication date: 28th August 2024
Operando Perovskite Interface Characterization using Photoemission Spectroscopy To enhance and refine perovskite optoelectronic devices, understanding the atomic and electronic structures of perovskite material interfaces is essential. X-ray-based spectroscopies, including photoelectron spectroscopy and X-ray absorption spectroscopy, provide element-specific, non-destructive chemical and electronic structure insights at the atomic level. With recent advancements at synchrotron facilities and methodologies developed by our team and others, these tools are rapidly advancing for energy material system studies. [1-3] They facilitate the examination of interface chemistry, energy alignment, valence and conduction band properties, and charge dynamics. In this presentation, we share our latest results using X-ray absorption spectroscopy and energy-dependent photoelectron spectroscopy on perovskite interfaces. Our research covers single crystal surfaces and interfaces to functional device structures. We illustrate how to analyze interface chemistry and determine energy alignment in perovskite/hole-conductor/metal interfaces, both in the dark and under visible light. Specifically, we will discuss operando measurements using hard X-ray photoelectron spectroscopy.
References:
1. Svanström, S et al ACS Appl. Mater. Interfaces 15, 12485–12494 (2023).
2. Man, G. J. et al. Phys. Rev. B 2021, 104, L041302
3. Garcia-Fernandez, A. et al., SMALL 2022, 18, 2106450
We thank the Swedish Research Council (Grant Nos. VR 2018-04125, VR 2018-06465, VR 2018-04330 and VR 2022-03168) and the Göran Gustafsson foundation for funding. This work was partially supported by the Wallenberg Initiative Materials Science for Sustainability (WISE) funded by the Knut and Alice Wallenberg Foundation.
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