Publication date: 28th August 2024
The performance of metal halide perovskite (MHP) thin films in optoelectronic devices is heavily influenced by their final crystal structure and nanomorphology. Therefore, understanding growth processes during deposition and post processing or ageing is important to control the performance in optoelectronic devices. I will show examples of the application of advanced in-situ characterization techniques to gain real-time insights into the formation and evolution of perovskite films. By monitoring the growth dynamics of perovskite thin films during solution processing, we can identify critical factors that govern the nucleation, intermediate phase formation, and final crystallization of the material. In-situ techniques such as grazing incidence wide angle X-ray scattering (GI-XRD), optical microscopy, and photoluminescence (PL) spectroscopy are employed to capture transient phases and intermediate states that are otherwise challenging to detect in ex-situ studies. Machine Learning approaches may help us in future to reduce characterization cost. This research contributes to the broader understanding of MHP thin film fabrication, offering guidelines for the scalable production of high-performance optoelectronic devices.