Proceedings of MATSUS23 & Sustainable Technology Forum València (STECH23) (MATSUS23)
DOI: https://doi.org/10.29363/nanoge.matsus.2023.158
Publication date: 22nd December 2022
When studying the opto-electronic properties of (nanostructured) semiconductors, Transient Absorption (TA) or pump-probe spectroscopy is often used to measure ultrafast changes optical properties due to photo-excitation. Besides making direct conclusions on carrier recombination processes, quantification of net optical gain or studying photo-induced absorption, a typical analysis that is done on such datasets is a Boltzmann fit on the high-energy tail from which the temperature of the photo-excited charge carriers can be extracted. Such information is vital in understanding carrier cooling bottlenecks which are detrimental for optical gain applications, but potentially very useful in solar energy conversion. Usually, this extraction of temperature is done for different pump-probe delays, excitation energies and different excitation powers to see the impact on the thermalization of the carriers.1 In this work, we take a more detailed look at what this high-energy tail actually entices for a direct gap semiconductor. We show that within this simple fitting approach, one gravely overestimates carrier temperatures and propose a more consistent modelling to find the temperature. Next, we compare this approach to Ultrafast Photoluminescence (UFPL) measurements on the same timescales as TA. We show that extracting the temperature is a more straightforward process for this approach.
I.T. Acknowledges FWO-Vlaanderen for a PhD Fellowship.