Proceedings of Asia-Pacific Conference on Perovskite, Organic Photovoltaics&Optoelectronics (IPEROP25)
Publication date: 17th October 2024
Metal halide perovskites have gained significant attention over the past decade due to their exceptional optoelectronic properties, low production costs, and ease of fabrication. In photovoltaic applications, such as solar cells, remarkable power conversion efficiency of perovskite devices has been achieved, exceeding 26% for single junctions and 33% for tandem solar cells [1]. However, their performance and stability are significantly impacted by the presence of structural defects in both the bulk and interfaces of the perovskite layers. These defects facilitate nonradiative recombination, reducing efficiency, and/or contribute to material and device degradation over time [2]. A detailed understanding of mechanisms behind perovskite growth, defect formation evolution, and their possible passivation during the deposition process is crucial to address these challenges.
In this work, we employ in situ photoluminescence spectroscopy during the vacuum co-deposition of wide-bandgap perovskite to study the evolution of defect density. This approach provides real-time insights into the dynamics of perovskite growth, optoelectronic properties, and defect formation. Moreover, it offers a direct perspective of the interface and bulk passivation methods applied. We believe that such a real-time study is a powerful and versatile tool for the optimization of perovskite fabrication and the passivation of defects.