Real-Time Study of Perovskite Thin Film Crystallization
Nada Mrkyvkova a b, Vladimir Held c, Peter Nádaždy b, Karol Vegso b, Quentin Guesnay d, Daming Zheng e, Peter Siffalovic a b
a Center for Advanced Materials Application, Slovak Academy of Sciences, Dúbravská cesta 9, 845 11 Bratislava, Slovakia
b Institute of Physics, Slovak Academy of Sciences, Dúbravská cesta 9, 845 11 Bratislava, Slovakia
c Instituto de Ciencia Molecular (ICMol), Universidad de Valencia, C/Catedrático J. Beltrán 2, Paterna 46980, Spain
d Ecole Polytechnique Fédérale de Lausanne (EPFL), Institute of Electrical and Microengineering (IEM), 10 Photovoltaics and Thin-Film Electronics Laboratory, Neuchâtel, Switzerland
e Chimie ParisTech, PSL Research University, CNRS, Institut de Recherche de Chimie Paris (IRCP), UMR8247, 11 rue P. et M. Curie, F-75005 Paris, France
Poster, Nada Mrkyvkova, 069
Publication date: 17th October 2024

Hybrid halide perovskites have emerged as a promising material for optoelectronic applications, particularly in solar cells and light-emitting diodes. While perovskite solar cells (PSCs) have achieved impressive power conversion efficiencies exceeding 25% [1], further advancements are hindered by defects and grain boundaries in polycrystalline films [2, 3]. Understanding the formation and evolution of perovskite phases is crucial for optimizing device performance.

In this work, we employ in situ grazing-incidence wide-angle X-ray scattering (GIWAXS) and photoluminescence (PL) to gain real-time insights into the structural and optoelectronic properties of perovskite films during their growth. By monitoring these properties in situ, we can elucidate the underlying mechanisms that influence the final device performance. We investigate perovskite films prepared by various deposition techniques, including spin-coating (in a nitrogen atmosphere), chemical vapor deposition, and vacuum deposition.

Our results reveal a non-monotonic trend in PL intensity during film formation, characterized by an initial increase followed by a decrease. This behavior is correlated with the evolution of the crystalline structure observed by GIWAXS. By understanding these dynamic processes, we can develop effective strategies to mitigate defect formation and improve the overall quality of perovskite films.

This work was supported by the IMPULZ program (IM-2023-82), SK-CZ-RD-21-0043, APVV-21-0297, and 2023/727/PVKSC.

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