NiOx nanoparticle/triazatruxene-based hole collecting monolayer in the inverted perovskite solar cell for its improved stability
Jakapan Chantana a, Shuhei Yamamoto a, Tamotsu Horiuchi a, Minh Anh Truong b, Atsushi Wakamiya b
a EneCoat Technologies Co.,Ltd.
b Kyoto University
Asia-Pacific International Conference on Perovskite, Organic Photovoltaics and Optoelectronics
Proceedings of Asia-Pacific International Conference on Perovskite, Organic Photovoltaics and Optoelectronics (IPEROP24)
Tokyo, Japan, 2024 January 21st - 23rd
Organizers: Qing Shen and James Ryan
Poster, Jakapan Chantana, 065
Publication date: 18th October 2023

Perovskite thin-film solar cell has been intensively investigated since 2009 with the enhancement of the power conversion efficiency (PCE) from 3.8% to 26.1% [1]. The inverted p-i-n planar perovskite solar cell has attracted much attention owing to its compatibility to high throughput manufacturing process. It was reported in 2018 that a mono layer hole collecting material in the inverted p–i–n perovskite gives rise to PCE of 17.8% [2]. Recently, triazatruxene-based hole collecting monolayer (PATAT) as a mono layer hole collecting material in the inverted perovskite solar cell has been introduced and enhance the PCE to 23% [3]. Inorganic hole transport layers (HTL) have been developed to improve the stability of the perovskite solar cells. Nickel oxide nanoparticle (NiOx NPs) as HTL has attracted attention owing to its wide bandgap, suitable valence band maximum, and inorganic nature making it stable against oxygen and moisture [4]. In this work, NiOx NPs and NiOx NPs/PATAT as HTL of the inverted perovskite solar cells have been therefore examined for the improved stability.

              The inverted perovskite solar cells were fabricated, where their device structure is composed of glass/ITO/HTL/perovskite absorber/ethylenediammonium diiodide (surface passivation)/C60/bathocuproine/Ag. Three HTLs of the inverted perovskite solar cells were investigated, which are (1) PATAT as reference, (2) NiOx NPs HTL, and (3) NiOxNPs/PATAT HTL. The NiOx NPs synthesis and solar cell fabrication are discussed elsewhere [3,4]. Here, the stability tests were performed under temperatures of 85 oC and 100 oC, dark, and open circuit, as well as under 1 SUN. Maximum power point tracking (MPPT) under illumination of 1 SUN was also investigated. For the stability tests under 85 oC, 100 oC, and 1 SUN, performances were periodically measured under both 1 SUN or 200 lx (LED 5,000 K).

              As a result, the PCE values of the inverted perovskite solar cells are 19% for (1) PATAT, 14.3% for (2) NiOx NPs HTL, and 19.3% for (3) NiOxNPs/PATAT HTL. In a case of (3) NiOxNPs/PATAT HTL, PATAT plays a vital role in increasing the PCE, which is attributable to the passivation of the interface defect of NiOx NPs HTL by PATAT. Moreover, under the stability test under 85 oC, the ratios of PCE at the final hour of 426 hours to that at initial hour (PCE426h/PCE0h) are 0.71 for (1) PATAT, 0.54 for (2) NiOx NPs HTL, and 0.79 for (3) NiOxNPs/PATAT HTL under 1 SUN. The ratio of maximum power at the final hour of 426 hours to that at initial hour (Pmax426h/Pmax0h) are 0.19 for (1) PATAT, 0.60 for (2) NiOx NPs HTL, and 0.90 for (3) NiOxNPs/PATAT HTL under 200 lx. Based on the results, (3) NiOxNPs/PATAT HTL presents the most stability under 1 SUN, and demonstrates significantly more stable under 200 lx. In addition, under MPPT, NiOx NPs presented in HTL shows more stable with the over 90% of initial PCE after 645 hours. It is deemed mobile ion migrates to HTL cause failure of the corresponding functional layer. Consequently, inorganic NiOx NPs could slow down the failure of the device. The detailed explanation will be further discussed under the stability tests under 100 oC, and 1 SUN.

This paper is based on results obtained from a project, JPNP21016, subsidized by the New Energy and Industrial Technology Development Organization (NEDO).

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