Publication date: 17th February 2025
Perovskite solar cells (PSCs) continue to show promise for next-generation photovoltaics, yet their long-term operational stability under real-world stress conditions remains a key challenge. In this work, we investigate the effect of temperature on halide-based PSCs subjected to thermal cycling under continuous illumination, with a focus on the temperature coefficient and its relation to charge transport mechanisms.
Devices were exposed to thermal cycles going from -40°C to 85°C (cell temperatures ranging from -5°C to 105°C) under 1000 W/m² irradiance. Current–voltage curves were measured every 5 minutes, with maximum power point tracking (MPPT) maintained between measurements. The protocol follows the ISOS-LT3 guidelines established in the ISOS consensus for stability testing [1] .
The evolution of normalized efficiency over time is shown in Figure 1 (left). Two distinct behaviours are observed at low and high temperatures, with degradation being more severe at lower temperatures compared to higher ones. The evolution of the temperature coefficients is presented in figure 1 (right). The observed inversion of behaviour at different range of temperature is hypothesized to be correlated with the accumulated thermal stress or the introduction of defects at high temperature.
This change in behaviour is tentatively attributed to degradation-induced modifications in charge carrier dynamics, including interfacial charge transfer. These effects may arise from inhibited ion motion or increased energetic barriers as discussed in literature [2], [3].
Our results highlight the importance of temperature coefficient tracking as a sensitive probe for degradation pathways in PSCs and its potential impact on the performance prediction for real operation conditions and thermal management for 2T-tandem devices conception.
I would like to express my gratitude to the Institut Photovoltaïque d’Île-de-France (IPVF) for its support and resources that made this work possible. I also extend my thanks to the Reliability team for their valuable expertise and insightful discussions.
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