Publication date: 17th February 2025
This study presents a comprehensive evaluation of the photoelectrical impact of surface and interfacial defects in the charge carrier dynamics of halide perovskite PV devices, with a particular focus on the beneficial role of grain boundary defects in enhancing nanoscale photovoltaic response, thereby improving the device performance. Utilizing different techniques of scanning probe microscopy (SPM), such as Kelvin probe microscopy (KPFM) and photo-conductive atomic force microscopy (ph-c-AFM), local current hysteresis loop at grains and grain boundaries allows us to visualize how these defects influence charge separation, collection, transport, ions/vacancies migration and recombination processes within perovskite solar cells. Our findings indicate that contrary to traditional views, certain grain boundary defects can enhance charge collection efficiency and contribute positively to the overall device performance. To harness this potential, we discussed three strategic approaches for controlling grain boundary and interface defects: (1) selecting an optimal electron transport layer that synergizes with the perovskite structure; (2) engineering the grain boundary structure to promote favourable electronic properties, and (3) adjusting humidity levels during processing to stabilize the perovskite phase and minimize detrimental defects. This multifaceted approach not only elucidates the complex role of defects but also provides practical insights for optimizing halide perovskite-based devices, paving the way for improved efficiency and commercial viability.
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