Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV24)
DOI: https://doi.org/10.29363/nanoge.hopv.2024.075
Publication date: 6th February 2024
The understanding of interfacial properties in perovskite devices under irradiation is crucial for their engineering, for instance in devices where electrodes are in direct contact with the perovskite such as certain scintillator designs.
We show how the electronic structure of the interface between CsPbBr3 perovskite nanocrystals (PNCs) and Au is affected by irradiation of X-rays, near infrared (NIR) and ultraviolet (UV) light. The effect of X-ray and light exposure could be differentiated by employing low-dose X-ray photoelectron spectroscopy (XPS) available at the Bessy II synchrotron in Berlin. A combination of a pulsed, low flux X-ray source, and a high transmission electron analyzer allow recording of XPS spectra without damaging even radiation sensitive samples. A coupled laser provides both NIR and UV light making it possible to isolate the effects of the light exposure.
Apart from the common degradation product of metallic lead (Pb0), a new intermediate component (Pbint) was identified in the Pb 4f XPS spectra after exposure to high intensity X-rays or UV light. The Pbint component is determined to be metallic Pb on-top of the Au substrate formed from underpotential deposition (UPD, a surface-limited redox process) of Pb induced from damage of the perovskite allowing for migration of Pb2+. This has implications on all devices where the perosvkite could come in contact with gold, and potentially also for other metals used as electrode materials.
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