Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV23)
DOI: https://doi.org/10.29363/nanoge.hopv.2023.149
Publication date: 30th March 2023
Over the past decade, hybrid halide perovskites have emerged as highly promising semiconducting materials for thin-film photovoltaics. Yet, continuing fundamental research is required to understand properties of these materials to unlock their full potential and to achieve durable perovskite photovoltaics. In this regard, employing of microscopy techniques is a promising approach to study fundamental properties of hybrid perovskites [1]. Microscopy techniques enable direct visualization of mesoscale disorder of hybrid perovskites that impacts the macroscale properties of these materials [2]. Among variety of microscopy techniques, photoemission electron microscopy (PEEM) is a powerful technique that provides valuable insights into the properties of hybrid perovskites on micro- and nanoscale. By employing PEEM, we have successfully imaged nanoscale surface defects in spin-coated perovskite films and demonstrated their roles in trapping of photoexcited holes [3]. We further uncovered the varied nature of these defects [4] and understood their roles in photo-degradation of hybrid halide perovskites [5].
In this talk, I will discuss in detail the principles of PEEM and will explain how this technique can be applied to study hybrid perovskites. I will introduce requirements for PEEM experiments, variety of possible measurements and will highlight considerations for imaging of surface defects of perovskite thin films. I will next discuss how to add time resolution to PEEM measurements and how to employ time-resolved PEEM (TR-PEEM) to study charge trapping dynamics of hybrid perovskites in space and time.