Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV22)
DOI: https://doi.org/10.29363/nanoge.hopv.2022.071
Publication date: 20th April 2022
Despite the rapid progress that hybrid perovskite solar cells have demonstrated during the past decade, much remains unknown about the processes that limit their performance and viability. In particular, the properties of perovskite absorbers require thorough research, especially for mixed compositions that have been employed for devices with highest efficiencies and have potential for applications in tandem technologies. Such perovskite films have been reported to have multiple scales of heterogeneities [1], some of which have been associated with presence of charge trapping defects that place substantial limitations on performance of perovskites [2, 3,4]. The fundamental understanding of these defects, in particular about their formation sites, and direct impact on device efficiency, is important for designing successful passivation strategies to improve performance and viability of perovskite photovoltaics.
In this work, we take a closer look at defect-mediated processes by directly visualizing defects and their spatio-temporal charge trapping dynamics. We employed photoemission electron microscopy to directly image nanoscale defects that form in solution processed perovskite films [2] and revealed their spatial arrangement with respect to surface microstructure. By adding time resolution to our photoemission experiments, we accessed the exact roles of these defects in performance of perovskite thin films by monitoring charge trapping processes that occur at defect-rich sites. We found that depending on their origin, these nanoscale defects play very different roles in photoexcited hole trapping – from very detrimental to relatively benign [5]. Our results shed more light on defect structure of perovskites and highlight the need to develop targeted approaches to remove each undesired type of defect.