Long-Term Stability of Large Area Perovskite Solar Cell under Thermal Stress
Fabio Matteocci a, Emanuele Calabrò a, Diego Di Girolamo b, Enrico Lamanna a, Danilo Dini b, Aldo Di Carlo a
a CHOSE - Centre for Hybrid and Organic Solar Energy, University of Rome ‘‘Tor Vergata’’, Via del Politecnico, 1, Roma, Italy
b Department of Chemistry, “La Sapienza” University of Rome, Piazzale Aldo Moro, 5, Roma, Italy
International Conference on Hybrid and Organic Photovoltaics
Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV19)
Roma, Italy, 2020 May 12th - 14th
Organizers: Prashant Kamat, Filippo De Angelis and Aldo Di Carlo
Oral, Fabio Matteocci, presentation 185
DOI: https://doi.org/10.29363/nanoge.hopv.2020.185
Publication date: 6th February 2020

The stability of the perovskite solar cell is the main topic for the validation of this photovoltaic technology at the industrial level. One of the major challenging topic is the achievement of the thermal stability measured following IEC protocols. Several degradation factors play a crucial role on the stability issue such like the contact migration and the iodine leakage in the perovskite absorber[1]. In this work, we will show how the the thermal stress at 85°C affects the performance of the perovskite solar cell in air. In particular, the open circuit voltage and the fill factor are the main parameters responsible of the decrease in power conversion efficiency[2]. We tested several type of encapsulated devices where the perovskite, the architecture and the interface are designed in order to evaluate the best strategy to achieve long-term stability. The results show that both nip and pin architectures suffer about the electrode migration especially when the electrode is thermally evaporated. Alternative electrodes based on ITO and Carbon are introduced to mitigate this effect. Furthermore, the role of the interfaces between the constituent layers will be reported by varying the perovskite composition and additives. Thanks to the optimization of the contact and the interfaces, T80 lifetime of more than 500 hours will be presented for both architectures.

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