Probing Degradation of Embedded Perovskite Photovoltaic Layer by Raman Spectroscopy
Wing Chung Tsoi a, Harrison Lee a, Michael Newman a, Trystan Watson b, Katherine Hooper b
a SPECIFIC, Swansea University, Baglan Bay Innovation and Knowledge Centre, Baglan, SA12 7AX, United Kingdom
b College of Engineering, Swansea University, UK, Bay Campus, Swansea SA1 8EN, United Kingdom
International Conference on Hybrid and Organic Photovoltaics
Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV16)
Swansea, United Kingdom, 2016 June 29th - July 1st
Organizers: James Durrant, Henry Snaith and David Worsley
Poster, Wing Chung Tsoi, 109
Publication date: 28th March 2016

It is important to probe the stability of perovskite photovotaic films (here we used MAPI as an example), particularly when it is embedded, such as that in a device. However, it is pretty challenge to probe it. Here, we demonstrated that Raman spectroscopy can be a powerful technique to probe the degradation of embedded perovskite photovoltaic films. We showed i. Raman can be used to probe perovskite film inside devices. ii. stability is improved significantly when the perovskite films are embedded, and depend on the underneath layer that the perovskite films deposited on. iii. Raman mapping is an elegant technique to image the distribution of degradation products (PbI2) in devices with spatial resolution of ~ 1µm, and is possible to estimation the amount of degradation product. Interestingly, we find the degradation is highly inhomogeneous in micro-meter scale. iv. We also performed in-situ/ex-situ Raman measurements: nitrogen vs air environment; as a function of temperatures; as a function of humidity. We found that for accelerated degradation, nitrogen reduce the degradation significantly, accelerated temperature studies show that the embedded perovskite films can be degraded, and which is likely to be accelerated with the presence of light. We also found that humidity causes structural degradation which has different origin to that induced by light (oxygen), and temperature, and the structural degradation clearly remained at the electrode regions after the humidity was returned to low level. Our overall results show that Raman (spectroscopy/mapping/in-situ) is an elegant, unique and powerful technique to probe the degradation in-depth of embedded perovskite photovoltaic films.



© FUNDACIO DE LA COMUNITAT VALENCIANA SCITO
We use our own and third party cookies for analysing and measuring usage of our website to improve our services. If you continue browsing, we consider accepting its use. You can check our Cookies Policy in which you will also find how to configure your web browser for the use of cookies. More info