Proceedings of International Conference on Hybrid and Organic Photovoltaics (HOPV16)
Publication date: 28th March 2016
It is important to probe the stability of perovskite photovotaic films (here we used MAPI as an example), particularly when it is embedded, such as that in a device. However, it is pretty challenge to probe it. Here, we demonstrated that Raman spectroscopy can be a powerful technique to probe the degradation of embedded perovskite photovoltaic films. We showed i. Raman can be used to probe perovskite film inside devices. ii. stability is improved significantly when the perovskite films are embedded, and depend on the underneath layer that the perovskite films deposited on. iii. Raman mapping is an elegant technique to image the distribution of degradation products (PbI2) in devices with spatial resolution of ~ 1µm, and is possible to estimation the amount of degradation product. Interestingly, we find the degradation is highly inhomogeneous in micro-meter scale. iv. We also performed in-situ/ex-situ Raman measurements: nitrogen vs air environment; as a function of temperatures; as a function of humidity. We found that for accelerated degradation, nitrogen reduce the degradation significantly, accelerated temperature studies show that the embedded perovskite films can be degraded, and which is likely to be accelerated with the presence of light. We also found that humidity causes structural degradation which has different origin to that induced by light (oxygen), and temperature, and the structural degradation clearly remained at the electrode regions after the humidity was returned to low level. Our overall results show that Raman (spectroscopy/mapping/in-situ) is an elegant, unique and powerful technique to probe the degradation in-depth of embedded perovskite photovoltaic films.