Failure mechanism for flexible dye-sensitized solar cells under repeated outward bending: Cracking and spalling off of nano-porous titanium dioxide film
a Xi'an Jiaotong University, Xianning West Road 28, Xi'an, 710049, China
b Xi'an Jiaotong University, Xianning West Road 28, Xi'an, 710049, China
International Conference on Hybrid and Organic Photovoltaics
Proceedings of International Conference on Hybrid and Organic Photovoltaics 2015 (HOPV15)
Proceedings of International Conference on Hybrid and Organic Photovoltaics 2015 (HOPV15)
Roma, Italy, 2015 May 11th - 13th
Organizer: Filippo De Angelis
Poster, Guanjun Yang, 285
Publication date: 5th February 2015
Publication date: 5th February 2015
Flexibility, as well as efficiency, of flexible dye-sensitized solar cells (DSCs) is of significant importance to their applications. Quantitative bending test was carried out with a lab-developed solar cell bending tester in order to simulate the flexible service condition. The photovoltaic performance, morphology of the photoanode and electrochemical property evolution during bending service were examined to aim at understanding the bending failure mechanism for the flexible DSCs under repeated outward bending (the TiO2film in the photoanode is in tension). Results show that when the bending radius is 12 mm, the efficiency of the plastic DSCs keeps unchanged with increasing the bending cycle. When the bending radius is smaller than 12 mm, the efficiency of the flexible DSCs decreases with increasing the bending cycle. The electrochemical impedance spectroscopy results show that the increase of the electron transport resistance (Rt) in TiO2network is responsible for the degradation of efficiency. Furthermore, the photoanodes after repeated bending is cracking and spalling off from the ITO surface. Finally, a failure model for the flexible DSCs under repeated outward bending is proposed.
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Jiang, C.Y.; Sun, X.W., Tan, K.W.; Lo, G.Q.; Kyaw, A.K.K.; Kwong, D.L.; Appl. Phys. Lett. 2008, 92, 143101. Li,Y.; Yoo, K.; Lee, D.K.; Kim, J.H.; Park, N.G.; Kim, K.; Ko, M.J.; Curr. Appl. Phys. 2010, 10, E171-E175. He, X.L.; Liu, M.; Yang, G.J.; Yao, H.L.; Fan, S.Q.; Li, C.J.; J. Power Sources 2013, 226, 173-178. He, X.L.; Yang, G.J.; Li, C.J.; Fan, S.Q.; Liu, M.; J. Power Sources 2015, 280, 182-189.
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