Proceedings of 6th International Conference on Hybrid and Organic Photovoltaics (HOPV14)
Publication date: 1st March 2014
Due to the rather low charge carrier mobilities in the photoactive layer of organic solar cells (OSC) the corresponding transport resistance is much higher as in e.g. silicon solar cells. It causes voltage drops which enhance recombination and limit the fill factor. We have successfully applied the Suns-Voc method to determine the transport resistance in OSC. In a Suns-Voc measurement a solar cell is illuminated by a flash light which decays over several orders of magnitudes in intensity while the open circuit voltage is continuously monitored. The intensity can be associated with an implied current density and thus a pseudo JV-curve is obtained. This pseudo JV-curve is the curve the solar cell would have if there was no series resistance[1]. It will be shown how it is possible - once the transport resistance is known - to derive both the intrinsic as well as the injection dependent charge carrier density of the photoactive layer[2]. These are important quantities for the theoretical description of OSC and our method can significantly narrow down their uncertainty and thus contribute to an improved understanding of the limiting factors of OSC. Furthermore, the method could also be applied to other type of solar cells which have a fill factor limitation related to the transport of charge carriers through the photoactive layer.
[1] S. Schiefer, B. Zimmermann, S. Glunz, U. Würfel, Applicability of the Suns-Voc method on OSC, IEEE J. of Photov. 4 (2014) 271–277. [2] S. Schiefer, B. Zimmermann, U. Würfel, Determination of the Intrinsic and the Injection Dependent Charge Carrier Density in OSCs Using the Suns-Voc Method, accepted in J. Appl. Phys.
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