Using Imaging Techniques for the Investigation of OPV Degradation
Roland Roesch a, Kai-Rudi Eberhardt a, Daniel Fluhr a, Marco Seeland a, Harald Hoppe a, Rolf Oettking a
a TU Ilmenau, Langewiesener Str. 22, Ilmenau, 98693, Germany
International Conference on Hybrid and Organic Photovoltaics
Proceedings of 6th International Conference on Hybrid and Organic Photovoltaics (HOPV14)
Ecublens, Switzerland, 2014 May 11th - 14th
Organizers: Michael Graetzel and Mohammad Nazeeruddin
Poster, Roland Roesch, 028
Publication date: 1st March 2014

A successful commercial application of organic solar cells is mainly determined by three factors: power conversion efficiency, costs and lifetime of the device. In this contribution we focus on the investigation of device stability employing imaging techniques. Several studies have already shown that often still the charge extracting and conducting electrodes may limit the overall device lifetime. Imaging characterization is especially well-suited for the investigation of device degradation as it constitutes a non-invasive measurement that can be repeatedly be applied on one and the same device during ageing. For example electrode oxidation and delamination and its penetration through photoactive layers can be readily investigated via luminescence and thermography imaging, respectively. We present several examples of electrode controlled device degradation by application of automated ageing setups in combination with imaging characterization. As a result we obtained a considerably more stable OPV device, approaching 20000 hours of extrapolated operation lifetime. In addition it is demonstrated that via imaging quantitative information can be obtained, enabling more precise predictions for device lifetime in the future.



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