Publication date: 8th June 2021
Emerging research on organic semiconductors increasingly points to control of ordering as key to extending the distances achievable for exciton transport by orders of magnitude. However, sources of crystallographic disorder are not well described, and the critical link between structural order and disorder and local or non-local changes in the optical states remains unresolved. Electron microscopy techniques combining high resolution electron energy loss spectroscopy (EELS) with diffraction contrast imaging and nanobeam scanning electron diffraction techniques present crucial routes to addressing these questions, despite the sensitivity of organic semiconductors to electron beam exposure. Here, spatially resolved aloof beam scanning with <30 meV resolution EELS provides insight into spectroscopic changes at singlet exciton energies co-located with linear crystal defects observed in a perylene diimide crystal. These observations are contextualised through comparisons between two derivatives with distinctive terminal functional groups. Detection of vibrational signatures with high-resolution EELS to evaluate beam-induced damage will also be presented alongside connections to ongoing work to unravel the precise crystal structures, disorder, and its pronounced effect on optoelectronic properties.
SMC acknowledges support from the Henslow Research Fellowship at Girton College, Cambridge, a University Academic Fellowship at the University of Leeds, and from a Goldstein Scholar Award from the Microanalysis Society. SuperSTEM is the U.K. National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council.
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