Publication date: 8th June 2021
In cathodoluminescence (CL) performed in a scanning transmission electron microscope (STEM), angle- and energy-resolved light detection enables the extraction of the coherently generated light phase due to interference. We demonstrate nanoscale field mapping, taking advantage of the light interference. The interference of multiple modes inside a single structure generates asymmetric mapping contrasts depending on the detection angle.[1,2] By controlling the electron beam and light detection, circularly polarized light with a chosen parity can also be generated from a spherical particle, based on the interference of the two orthogonal modes with a relative phase shift.[3] With reference light, for which we use transition radiation from a flat metal surface, one can also map the interference pattern of the scattering through surface plasmon polaritons. We extracted the phase of plasmonic particles placed on a metal surface and visualized the propagating surface plasmon polaritons around the particle.[4] Such measurement is most efficiently performed by 4D-STEM-CL which enables simultaneous acquisition of energy-, angle-, and 2D space-information.[3] If time allows, our recent development of TEM with a linear accelerator and decelerator will also be presented. In this instrument, electrons gain and lose energy of a few hundreds of keV from RF electromagnetic waves.[5]
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