Proceedings of Perovskite Thin Film Photovoltaics (ABXPV16)
Publication date: 14th December 2015
In this study we examine the effect of two processing parameters on the characteristics of CH3NH3PbI3-xClx perovskite films and associated device performance: 1) the porosity and semiconductor properties of TiO2 mesoporous films; and 2) the use of a chloride sensitization treatment applied to the TiO2 scaffolds prior to deposition of the perovskite material. The device performance results are based on the fabrication and testing of 60 devices prepared according to the single-step deposition method, with 10 repeat devices per type of cell. The highest efficiency, 10.0 %, was achieved for a device prepared on a P25-based TiO2 film which in-house paste composition and deposition process is suitable for roll-to-roll large scale production of perovskite PV.
Three types of TiO2 mesoporous films were produced from organic pastes: DSL-18NRT diluted with ethanol (A), DSL-18-NRT with additional ethyl cellulose (A’) used to emphasize the porosity of the resulting TiO2 scaffolds, and a P25 TiO2-based paste (B). All films were characterized with similar thickness (~ 200 nm), however much denser films resulted from the application of paste A compared to the pastes A’ and B for which the presence of additional ethyl cellulose or coarser particles provided the scaffolds with macroporous features (> 50 nm). Overall, higher fill factors were obtained for devices produced on films A’ and B compared to A (respectively 68, 62, and 60 %) owing to the better infiltration of the perovskite material through the porous structure of the TiO2 films. The presence of rutile TiO2 and overall coarser particles in paste B resulted in slightly lower Voc.
Current research in the field of lead halide perovskite materials suggests that the presence of chloride ions in the precursor solution may catalyse the crystallization of CH3NH3PbI3-xClx perovskite. Here, we show based on XRD and FEG-SEM analyses that the presence of chlorides adsorbed at the surface of the TiO2 (confirmed by XPS data) has very little effect of the coverage yield or crystalline features (shape and range) of the perovskite films. However, when compared to devices prepared on untreated TiO2 scaffolds, devices prepared on all types of Cl-treated TiO2 films exhibited lower FF and Jsc , leading to an overall decrease in average efficiencies of 1-3 %. These observations will be discussed based on results collected from a variety of complementary analytical techniques, including XRD, FEG-SEM, photoluminescence, XPS etc.
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